The advantage of optical emission spectrometry (OES) over other techniques is its short analysis time with outstanding precision - even at low element contents. The measurement is just as fast as with a handheld analyzer for X-ray fluorescence analysis (XRF): many measurements take only a few seconds. In contrast to XRF handheld analyzers, no special training or proof of radiation protection is required. Our optical emission spectrometers can be used safely and conveniently after a short instruction.
Measurements of elements such as carbon, sulfur, phosphorus, boron, lithium, beryllium, calcium, silicon, magnesium and aluminum with low contents can only be analyzed insufficiently or not at all with XRF handheld analyzers due to the lack of sensitivity of the technology. Optical emission spectrometry with spark excitation, on the other hand, allows a much more precise measurement.
However, the precise analysis of these elements is essential for reliable Positive Material Identification (PMI) for many steel alloys and non-ferro alloys. For example, the alloys 316 (1.4401) and 316L (1.4404) can only be differentiated via their carbon content.